Abstract
1/2012
vol. 114
Review paper
Contemporary applications of wavefront aberrometry in ophthalmology practice
- Oddział Okulistyki Okręgowego Szpitala Kolejowego w Katowicach
- Instytut Fizyki Politechniki Wrocławskiej
- Ophthalmology Unit, Department of Surgical Specialities, University of Messina, Italy
Klinika Oczna 2012, 114 (1)
Online publish date: 2012/03/29
The aim of the article is to present and summarize the current knowledge of wavefront aberrations, methods and applications
of aberrations measurement. Ideal optical system is stygmatic, which means that object point is imaged by optical system into
the image point without deformation. Optical system of the eye is not ideal, it has aberrations. Aberrations limitate and determine visual quality. Wavefront aberrometers measure manochromatic low and high order aberrations. Wavefront aberrations are
described by Zernike polinomials. More important wavefront sensor types are described in the article. In their practice authors
use KR1W Topcon aberrometer. Authors also present difficulties in taking aberrometric measurements. In recent years quality
of vision becomes the point of interest for vision scientists. Correction of high order aberrations is the future of optics.
of aberrations measurement. Ideal optical system is stygmatic, which means that object point is imaged by optical system into
the image point without deformation. Optical system of the eye is not ideal, it has aberrations. Aberrations limitate and determine visual quality. Wavefront aberrometers measure manochromatic low and high order aberrations. Wavefront aberrations are
described by Zernike polinomials. More important wavefront sensor types are described in the article. In their practice authors
use KR1W Topcon aberrometer. Authors also present difficulties in taking aberrometric measurements. In recent years quality
of vision becomes the point of interest for vision scientists. Correction of high order aberrations is the future of optics.
Keywords
wavefront, monochromatic aberrations, aberrometry
Integrated with
