The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM)

Jakub Kałużny; Janusz Szatkowski

Full text

5/1998 vol. 100

The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM)

Jakub J. Kałużny

,

Janusz Szatkowski

Data publikacji online: 2024/03/28

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AMA

Kałużny JJ, Szatkowski J. The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM). Klinika Oczna / Acta Ophthalmologica Polonica. 1998;100(5).

APA

Kałużny, J. J., & Szatkowski, J. (1998). The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM). Klinika Oczna / Acta Ophthalmologica Polonica, 100(5).

Chicago

Kałużny, Jakub J, and Janusz Szatkowski. 1998. "The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM)". Klinika Oczna / Acta Ophthalmologica Polonica 100 (5).

Harvard

Kałużny, J., and Szatkowski, J. (1998). The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM). Klinika Oczna / Acta Ophthalmologica Polonica, 100(5).

MLA

Kałużny, Jakub et al. "The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM)." Klinika Oczna / Acta Ophthalmologica Polonica, vol. 100, no. 5, 1998.

Vancouver

Kałużny J, Szatkowski J. The evaluation of surface deposits on frequent replacment lenses by scanning electron miscroscope (SEM). Klinika Oczna / Acta Ophthalmologica Polonica. 1998;100(5).

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